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價格均為含稅價,滿1000元享免運優惠!歡迎公司及學校機關團體大量採購, 由專人提供專案報價。
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與傳統的 Open-Short 量測設備相比,iOST的出色設計具有更高的速度、更準確、更智慧的使用體驗。為客戶提供半導體封裝測試流程的最高效率和品質。
全店,滿千郵寄超商純取免運優惠
商品存貨不足,未能加入購物車
您所填寫的商品數量超過庫存
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高引腳計數
最大通道數高達 16,384。基於即時多工處理設計,即使運行16,384CH系統,延遲時間也比上一代2,048CH系統縮短50%。一個主機殼最多支援2,048個通道(每個主機殼有16個CH板,每128CH為一個CH板),LB電纜與上一代系統完全相容。
高性能
聰明
System Performance | PC Interface | 1-Port USB | ||
Max. Pin-Count | 16384 (128CH~16384CH) | |||
Test Time (8192-pin System) | 0.4mS Per Pin Typically (Test Current= 100uA, CV= 3.0V) | |||
A/D, D/A Resolution | 16-bit | |||
Handler Interface | 1. Support Maximum 16-Site HIF (*1) 2. SOT, EOT, BIN1/BIN2/BIN3, RET Handshaking (*2) 3. TTL/CMOS, 3.3~15V, with Optical Isolator | |||
Operation | 1. 4-quadrant operation: Pin-to-Pin, Pin-to-All, All-to-Pin 2. Force Current Measure Voltage (FIMV), with Voltage Clamping 3. Force Voltage Measure Current (FVMI), with Current Clamping 4. Leakage Current Measurement 5. I-V Curve and V-T Curve analysis 6. Kelvin 4-wire Architecture | |||
APMU Resolution Accuracy (*3) | Force Voltage | ±10.0V | 0.313mV | ± 0.3% |
Force Current | ± 10.0uA | 0.156nA | ± 0.4% | |
± 0.1mA | 1.562nA | ± 0.2% | ||
± 1.0mA | 15.62nA | ± 0.2% | ||
± 10.0mA | 156.2nA | ± 0.2% | ||
Measure Voltage | ± 1.0V | 0.032mV | ± 0.1% ± 1.0mV | |
± 2.0V | 0.063mV | ± 0.1% ± 1.0mV | ||
± 4.0V | 0.125mV | ± 0.1% ± 2.0mV | ||
± 8.0V | 0.250mV | ± 0.1% ± 4.0mV | ||
Measure Current | ± 10.0uA | 0.313nA | ± 0.2% ± 0.01uA | |
± 100.0uA | 3.125nA | ± 0.1% ± 0.10uA | ||
± 1.0mA | 31.25nA | ± 0.1% ± 1.00uA | ||
± 10.0mA | 312.5nA | ± 0.1% ± 10.0uA | ||
Measure Leakage (*4) | 10~200nA | 0.078nA | ± 1.0% ± 0.5nA | |
0.2-3.0uA | 0.156nA | ± 0.5% ± 5.0nA | ||
Software Application | OS | Windows XP/XP Pro, Windows 7/8/10 or higher version | ||
Operation | 1. Production/Engineer mode controlled by Password 2. Smart Program Auto-Learning/Program Editor 3. Real-Time Production Status Monitoring 4. Manual Pin-Testing/Analysis, Production Statistics Logger/Analysis 5. One-Key Self-Calibration/Fully Self-Diagnostics | |||
File I/O | 1. Text Engineering Statistics file 2. Text Production Logger/Fault Analy sis file 3. Text Wire definition/Test Program file 4. Text System Configuration file | |||
*1: Standard equipped 2-Site/8-Site HIF. 16-Site HIF is optional, TBD *2: RET function of HIF is optional, TBD *3: Accuracy ± (% of Display ± Offset), 1 Year, 23℃ ± 5℃ *4: Guaranteed by parametric design, not subject to production test |